Ortega-Esteban A, Horcas I, Hernando-Pérez M, Ares P, Pérez-Berná AJ, San Martín C, Carrascosa JL, de Pablo PJ, Gómez-Herrero J.

In this work we present an improved jumping mode procedure that allows detecting the tip–sample contact with high accuracy, thus minimizing the scanning forces (∼100 pN) during the approach cycles. To illustrate this method we report images of human adenovirus and T7 bacteriophage particles which are prone to uncontrolled modifications when using conventional jumping mode.